
Manufacturer
Agilent
Model
G200
Category
Materials characterization
Application
Micromechanical characterization of thin films and coatings, nanomaterials and surface layers of bulk materials
Description
- Optimum indentation depth range 100-2000 nm
- Load resolution – 50 nN
- Displacement resolution – <0.01 nm
- Usable sample area –typically up to 32 mm